Limiting current density in electrochemical micromachining
نویسندگان
چکیده
منابع مشابه
Distance effects in electrochemical micromachining
Considering exponential dependence of currents on double-layer voltage and the feedback effect of the electrolyte resistance, a distance effect in electrochemical micromachining is found, namely that both time constant and double-layer voltage depend on the separation of electrodes. The double-layer voltage is the real voltage used in processing. Under DC voltage, the apparent voltages between ...
متن کاملEvaluation of limiting factors for current density in microbial electrochemical cells (MXCs) treating domestic wastewater
This study quantitatively assessed three limiting factors for current density in a microbial electrochemical cell (MXC) treating domestic wastewater: (1) buffer concentration, (2) biodegradability, and (3) particulates. Buffer concentration was not significant for current density in the MXC fed with filtered domestic wastewater (180 mg COD/L). Current density reduced by 67% in the MXC fed with ...
متن کاملModeling current density distribution in electrochemical systems
A numerical method was developed for predicting current density distribution in electrochemical systems of several species at steady-state. The fundamental transport equation consisted a partial differential equation (PDE) involving linear terms of diffusion and laminar convection, and nonlinear terms of ionic migration. The boundary conditions (BCs) consisted also PDEs including flux condition...
متن کاملElectrochemical Thin Films at and above the Classical Limiting Current
We study a model electrochemical thin film at DC currents exceeding the classical diffusion-limited value. The mathematical problem involves the steady Poisson–Nernst–Planck equations for a binary electrolyte with nonlinear boundary conditions for reaction kinetics and Stern-layer capacitance, as well as an integral constraint on the number of anions. At the limiting current, we find a nested b...
متن کاملLimiting current density in a crossed-field nanogap.
Using a mean-field theory, we have studied the quantum extension on the limiting current density in a crossed-field nanogap. When the gap spacing is less than the electron wavelength, our results show that the limiting current density is increased by a large factor from the classical values due to the effects of electron tunneling. The effects of the external magnetic field diminish with a decr...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Journal of Electrochemical Science and Engineering
سال: 2018
ISSN: 1847-9286
DOI: 10.5599/jese.538